NANOSENSORS™ Announces New high-Q AFM probe

NANOSENSORS™ announces the Q30K-Plus -- a scanning probe with a high Q-factor especially designed for UHV applications.

Neuchâtel/Switzerland (PRWEB) October 29, 2005 -- NANOSENSORS™ today announced the Q30K-Plus, a novel scanning proximity probe with a very high Q-factor and an enhanced signal to noise ratio for UHV applications.

Based on the well-known PointProbe® Plus FM (Force Modulation) AFM probe NANOSENSORS™ has developed the Q30K-Plus SPM-probe series especially for UHV applications. For high sensitivity and a good signal to noise ratio the new probes are featuring a Q-factor of over 30,000 (up to 50,000) under UHV conditions and a high reflectivity (even at wavelength of over 800nm).

In addition to the enhanced Q-factor and the optimized signal to noise ratio the Q30K-Plus series offers all features of the PointProbe® plus series like a minimized variation in tip shape and a typical tip radius of less than 7nm.

The first product of the new Q30K-Plus line will be commercially available starting January 2006 in the versions PPP-QFMR and PPP-QNCHR. Other types for different operation modes and different tip shapes are being developed.

About NANOSENSORS™:

NANOSENSORS™ is specializing in the development and production of innovative high quality probes for scanning probe microscopy (SPM) and atomic force microscopy (AFM). The products are especially designed for scientists at universities, research institutions and industrial R&D centres in the fields of nanotechnology, microtechnology, materials research, semiconductors, biology, biotechnology, chemistry and medicine. NANOSENSORS is a trademark of NanoWorld AG.

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