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AMS Technologies announces new 10 Gb/s Electro-Optic Testing Products from JDS Uniphase
AMS Technologies announces new 10 Gb/s Electro-Optic Testing Products from JDS Uniphase
Stressed Eye Tester, Optical Pattern Generator and Optical Error Detector offer solution for testing to IEEE 10 Gigabit Ethernet Standard 802.3ae
JDS Uniphase Corporation just announced three new electro-optic test instruments that offer an economical solution for stressed eye testing as specified in IEEE 10 Gigabit Ethernet Standard 802.3ae. The measurement comprises controlling the extinction ratio (ER), the electrical bandwidth for ISI, AM interference, and timing jitter for receiver conformance testing.This low cost test solution for the new standard integrates includes the following new JDS Uniphase Instrumentation products:
· The OPTX10A Stressed Eye Generator is a versatile 1310 nm or 1550 nm reference transmitter supporting data rates of 10.71 Gb/s to 155 Mb/s. The OPTX10A features an adjustable extinction ratio from 10 dB to 3 dB, selectable electrical signal paths (internal pass through and standard 4-poll Bessel Thomson, and external filter), and sinusoidal amplitude interference input.
· The OPG10A Optical Pattern Generator and OED10A Optical Error Detector are optical bit error rate testers (BERTs) that feature excellent sensitivity and overload performance. The OPG10A includes an option for input frequency offset supporting sinusoidal timing jitter generation and serial electrical output.
The Optical Pattern Generator and Optical Error Detector are also ideal for Physical Layer component/module manufacturing test needs. The units support the key 10 Gb/s data rates: SONET/SDH standard; FEC 9.96 Gb/s, 10.66 Gb/s and 10.71 Gb/s; 10 Gigabit Ethernet 10.3125 Gb/s; Fiber Channel 10.5 Gb/s and provide five selectable patterns with error insertion control. The Optical Pattern Generator includes an internal clock source and clock/16 and pattern trigger outputs, while the Optical Error Detector includes clock recovery and clock/16 output.
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