Home
Learn More
Features & Pricing
Success Stories
Contact Us
Search Archives
PRWeb Direct
Submit Release
August 21, 2008
 
Industry Categories  
News by Country  
News by MSA  
Todays News  
Browse by Day  
PR Trackbacks™  
Featured Videos  
ViewNews™  
eBook Digests  
RSS  
PRWeb, a leader in online news and press release distribution, has been used by more than 40,000 organizations of all sizes to increase the visibility of their news, improve their search engine rankings and drive traffic to their Web site.
 
All Press Releases for September 7, 2005 Subscribe to this News Feed      
 

RELEX Free Webcast: Microscopy for Nanomaterials Characterization by Dr. Nan Yao from Princeton University

"Microscopy for Nanomaterials Characterization," a free Webcast by Dr. Nan Yao, Director of the Imaging and Analysis Center, Materials Institute, Princeton University - is now available on-demand

New York, NY (PRWEB) September 7, 2005 - The free Webcast "Microscopy for Nanomaterials Characterization," by Dr. Nan Yao, Director of the Imaging and Analysis Center, Materials Institute, Princeton University - is now available on-demand.

This Webcast was first broadcasted live at the Research Lab Expo (RELEX), an online conference and virtual exhibition launched by the Reed Business Information Science.

To register for this free Webcast, visit: http://relex.unisfair.com/registration.jsp?code=1225

Webcast Summary:
Science and technology are ever seeking to build structures of progressively smaller size. This effort at miniaturization has finally reached the point where structures and materials can be built through "atom-by-atom" engineering. Typical chemical bonds separate atoms by a fraction of a nanometer (10-9 m), and the term nanotechnology has been coined for this emerging area of development.

By manipulating the arrangements and bonding of atoms, materials can be designed with a far vaster range of physical, chemical and biological properties than has been previously conceived. But how does one characterize the relationship between starting composition, which can be controlled, with the resulting structure and properties of a nanoscale-designed material that has superior and unique performance?

Microscopy is essential to the development of nanotechnology, serving as its eyes and hands. This presentation comprehensively covers the state-of-the-art electron and ion microscopy techniques that observe, characterize, measure and manipulate materials on the nanometer scale.

To register for this free Webcast, visit: http://relex.unisfair.com/registration.jsp?code=1225

About Dr. Nan Yao:
Nan Yao is the Director of the Imaging and Analysis Center at Princeton Institute for the Science and Technology of Materials, Princeton Univ. After receiving a Ph.D. in applied physics and electron microscopy from Arizona State Univ., Yao went to work in the field of industry, first at the Shell Development Co., then at the Exxon Research and Engineering Co.

Yao joined Princeton Univ. in 1993 to help build an imaging and analysis program, which now is one of the preeminent imaging and analysis centers in the country. Yao is on the faculty of Materials Science and Engineering and is a Senior Research Scholar with continued appointment at Princeton.

His research has focused on using advanced imaging and spectroscopy techniques to conduct fundamental studies of the structure-composition-processing-property relationships in complex materials such as self-assembled organic/inorganic composites, functional block copolymer thin films, carbon nanotubes, superconductors, minerals, ferroelectric nano-crystallites, and other materials. Yao has recently published a book entitled Handbook of Microscopy for Nanotechnology" and authored over 130 research papers.

He is also on the Editorial Board for three professional journals and serves as a referee for many others. For the past several years, Yao has chaired and co-chaired eight international symposia and served on the NASA panel for Ceramic and Nanotechnology. He is actively involved in teaching activities for both graduate and undergraduate students. Currently, he teaches a core course entitled "Characterization of Materials" and co-teaches two other courses at Princeton.

To register for this free Webcast, visit: http://relex.unisfair.com/registration.jsp?code=1225

About RELEX:
The Research Lab Expo (RELEX) is an online conference and virtual exhibition launched by the Reed Business Information Science Group. The online event features a high quality educational forum comprised of multiple live free Webcasts.

The Research Lab Expo offers cutting-edge compelling web content to industry professionals and decision makers across multiple industries, including aerospace and defense, automotive, chemicals, petroleum, coatings, inks, adhesives, textiles, computers, software, office equipment, energy, utilities, environmental, food, beverage, tobacco, government lab, industrial equipment, instruments, laboratory, design, manufacturing, metal, materials, pharmaceuticals, biopharmaceuticals, healthcare, plastic, rubber, paper, pulp wood, scientific, medical, test instruments, semiconductors, electronic components, and telecom.

###

Other Releases by this Member
OPTIONS
Printer Friendly Version
Email this story to a colleague
CONTACT INFORMATION
Boaz Babai
ARPU~UP
+972-54-5700157
Email us Here
ATTACHED FILES

There are no multimedia files attached to this release. If this is your release, you may add images or other multimedia files through your login.

ABOUT PRESS RELEASES
If you have any questions regarding information in these press releases please contact the company listed in the press release. Please do not contact PRWeb. We will be unable to assist you with your inquiry. PRWeb disclaims any content contained in these releases. Our complete disclaimer appears here.
 
Disclaimer: If you have any questions regarding information in these press releases please contact the company listed in the press release.
Please do not contact PRWeb®. We will be unable to assist you with your inquiry.
PRWeb® disclaims any content contained in these releases. Our complete disclaimer appears here.

© Copyright 1997-2008, Vocus PRW Holdings, LLC.
Vocus, PRWeb and Publicity Wire are trademarks or registered trademarks of Vocus, Inc. or Vocus PRW Holdings, LLC.

Terms of Service | Privacy Policy | Copyright