NanoWorld AG Announces Pyrex-Nitride AFM Probe

NanoWorld AG announced that will offer a new Silicon-Nitride probe for Atomic Force Microscopy in the future

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Neuchâtel/Switzerland (PRWEB) February 20, 2006

NanoWorld today officially announced its new Pyrex-Nitride™ AFM probe.The Pyrex-Nitride™ probe combines silicon nitride cantilevers and tips with the proven glass chip concept. These new probes will be available as rectangular cantilevers as well as in a triangular version. The Pyrex-Nitride™ series has been designed for a great variety of imaging techniques like in air and liquid. The cantilevers have a backside reflective coating of chromium and gold.

The Pyrex-Nitride™ probes will become commercially available in June 2006.

About NanoWorld AG:

Swiss-based NanoWorld AG is a leading manufacturer of high quality tips for Scanning Probe Microscopy (SPM) and Atomic Force Microscopy (AFM). The Atomic Force Microscope (AFM) is the vital instrument for the whole field of nanoscience and nanotechnology. It enables its user coming from research and commercial nanotechnology businesses to investigate materials on an atomic scale. Scanning probes for Atomic Force Microscopy produced by NanoWorld AG are the key consumable, the “finger” that enables the scientist to scan surfaces point-by-point on an atomic scale. The consistent high quality of the scanning probes is vital for reproducible results.

Using NanoWorld’s high precision AFM Probes helps researchers to get the best results they need for atomic force microscopy (AFM).

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Contact

  • Michaela Roessger
    NANOWORLD AG
    41-32-720-5325
    Email

Attachments

NanoWorld Pyrex-Nitride AFM probe NanoWorld Pyrex-Nitride AFM probe

sketch of the new NanoWorld Pyrex-Nitride AFM probe


Sketch of Pyrex-Nitride AFM probe Sketch of Pyrex-Nitride AFM probe

Sketch of Pyrex-Nitride AFM probe with triangular cantilevers