We are very pleased that T&M World has recognized the significance of the NI CompactDAQ system with its Best in Test award
Austin, TX (PRWEB) January 15, 2007
Editors at Test & Measurement World named the NI CompactDAQ USB-based modular data acquisition system from National Instruments (Nasdaq: NATI) a Best in Test winner and a finalist for the Test Product of the Year in the publication's 2007 Best in Test Awards.
"Our readers can benefit from rugged, portable and modular data acquisition systems that are flexible and easy to use," said Rick Nelson, chief editor of Test & Measurement World. "NI CompactDAQ fits the bill in that it combines plug-and-play USB capability with high-speed analog and digital I/O for factory, lab and field applications."
The NI CompactDAQ system offers an eight-slot chassis that accepts I/O modules capable of measuring up to 256 channels of electrical, physical, mechanical and acoustic signals in a single system. NI CompactDAQ delivers connectivity and signal conditioning for measurements including voltage, temperature, strain, sound and vibration, as well as digital I/O and switching. All modules are hot-swappable and autodetectable for simplified setup, and offer up to 2,300 Vrms of isolation to ensure PC and user safety. The system is ideal for sensor and electrical measurements on the benchtop, in the field and on the production line.
Through signal streaming technology developed by National Instruments, NI CompactDAQ delivers four dedicated USB signal streams for synchronous analog and digital I/O. This high-bandwidth technology is necessary for data-intensive applications including sound and vibration, mixed-signal automated test and high-speed data logging. In addition, the small size (25 by 9 by 9 cm) and flexible power options (AC or 11 to 30 VDC) make NI CompactDAQ ideal for a wide range of test settings, such as in-vehicle, benchtop and automated test applications.
"We are very pleased that T&M World has recognized the significance of the NI CompactDAQ system with its Best in Test award," said Tim Dehne, NI senior vice president of R&D. "NI invests heavily in R&D, resulting in high-quality, high-performance products that revolutionize the way engineers and scientists work. The NI CompactDAQ system modular data acquisition system takes full advantage of the bandwidth of Hi-Speed USB and minimizes both size and power consumption for portable requirements. It provides fast and accurate measurements in a small, simple and affordable system."
Nominations for the Best in Test competition were submitted by manufacturers and users of products introduced between Nov. 1, 2005, and Oct. 31, 2006. The magazine publishes its list of Best in Test finalists in December and asks readers to vote for the Test Product of the Year. Representatives from Test & Measurement World will announce the results at the APEX/IPC trade show Feb. 20-22 in Los Angeles.
About National Instruments
For more than 30 years, National Instruments has been a technology pioneer and leader in virtual instrumentation - a revolutionary concept that has changed the way engineers and scientists in industry, government and academia approach measurement and automation. Leveraging PCs and commercial technologies, virtual instrumentation increases productivity and lowers costs for test, control and design applications through easy-to-integrate software, such as NI LabVIEW, and modular measurement and control hardware for PXI, PXI Express, PCI, PCI Express, USB and Ethernet. Headquartered in Austin, Texas, NI has more than 4,000 employees and direct operations in nearly 40 countries. For the past eight years, FORTUNE magazine has named NI one of the 100 best companies to work for in America.
Readers can obtain investment information from the company's investor relations department by calling (512) 683-5090 or visiting http://www.ni.com/nati.
LabVIEW, National Instruments, NI, NI CompactDAQ and ni.com are trademarks of National Instruments. Other product and company names listed are trademarks or trade names of their respective companies.