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All Press Releases for March 26, 2007 Subscribe to this News Feed    
 

UV-Visible-NIR Microscope for Broadband Inspection

CRAIC Technologies introduces the UVM-2 broadband microscope for UV, visible and NIR range microscopy in both transmission and reflectance.

(PRWEB) March 26, 2007 -- CRAIC Technologies, the leader in UV-visible-NIR microscopy and microspectroscopy, today released the new UVM-2™ Broadband Microscope. This new instrument represents a major step forward in the field of microscopy as it is able to image from 250 to 2000 nm over narrow bands or large spectral regions. The UVM-2™ can acquire transmission and reflectance microscopic images with sub-micron resolutions.

"The UVM-2™ was developed in response to customer requests for UV and NIR imaging. This system allows for our customers to acquire high resolution micrographs quickly, easily and non-destructively. The UVM-2™ is designed to meet those requirements with a robust and durable instrument," says Dr. Jumi Lee, Senior Vice President. "With such features as broadband optics, broadband light sources and digital UV and NIR imaging, this microscope can be used for scientific research and industrial quality control in many different fields."

The UVM-2™ uses range from purely scientific research to industrial applications to quality control. For example, the UVM-2™ is equally at home being used for inspection the interior structures of bonded silicon devices as it is directly imaging protein crystals used in pharmaceutical research. Absorbance, transmission, and reflectance illumination in the UV, visible and near infrared regions can all be done with the same microscope.

CRAIC is dedicated to working with its customers to enable them to obtain and maintain the latest microscopy technology. The UVM-2™ is an example of this dedication. For more information on this and other products, please contact CRAIC Technologies.

About CRAIC Technologies, Inc.
CRAIC is a leader in the design, manufacture and marketing of high-performance UV-visible-NIR range microscopes and microspectrometer systems. CRAIC instruments are used in a diverse range of fields including forensics, semiconductor metrology, flat panel display metrology, chemistry, biology and physics. Located near Los Angeles, at the foot of the San Gabriel Mountains, CRAIC's website is www.microspectra.com.

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CONTACT INFORMATION
Dr. Paul Martin
CRAIC Technologies, Inc.
310-573-8180
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ATTACHED FILES

UV Image of Contaminants on Semiconductor Chip
Semiconductor chips are often contaminated by materials that are not visible to the human eye. UV image clearly shows them.

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