International Test Solutions Appoints Danny Chiu to Head Asia Applications Engineering and Support Organization

Danny Chiu has been brought on as International Test Solutions' Applications Manager for Asia where he will work to strengthen engineering and business support efforts in Taiwan and mainland China.

Reno, Nevada (PRWEB) February 14, 2008 -- International Test Solutions (ITS) announced that Danny Chiu has been appointed as the Applications Manager - Asia effective February 1, 2008. Mr. Chiu joins International Test Solutions after a 9-year career at Spirox Corporation (Taiwan), where he held significant technical support and sales leadership positions. He will provide readily accessible technical and local commercial support to our existing and future customers in Taiwan and mainland China.

Gene Humphrey, President of ITS, commented, "I am very excited to have Danny join our organization. He is a highly qualified and experienced team player familiar with the specific needs and application requirements of the Taiwanese customer base. Danny's leadership in Asia will be a tremendous asset as International Test Solutions continues to expand into new markets."

I am very excited to have Danny join our organization. He is a highly qualified and experienced team player familiar with the specific needs and application requirements of the Taiwanese customer base. Danny's leadership in Asia will be a tremendous asset as International Test Solutions continues to expand into new markets.

I am very excited to join the experienced International Test Solutions Technical Team and look forward to working closely with customers throughout Asia.

Mr. Chiu will be responsible for managing the company's new branch office in Zhubei City, Taiwan. The office is located at 7F.-8, No.9, Zhuangjing 6th St., Zhubei City, Hsinchu County 30264, Taiwan (R.O.C)

About International Test Solutions, Inc. (ITS)
International Test Solutions provides non-destructive probe card cleaning products used by semiconductor manufacturers to remove debris and contaminants generated during wafer level and burn-in/test socket testing. By removing loose debris and adherent contaminants in-line, the quality of the testing data is improved, the test equipment downtime is reduced, throughput is increased and manufacturing yields are improved.

For more information about International Test Solutions, or this particular news article, please contact Tina Romero at (1) 775.284.9220 or (sales @ inttest.net).

# # #

Post Comment:
Trackback URL: http://www.prweb.com/pingpr.php/U2luZy1DcmFzLUxvdmUtTG92ZS1aZXRhLVplcm8=

its international test solutions probe cleaning non-abrasive probe card cleaning debris collection wafer sort products contactor products probe needle cleaning probe card cleaning probe clean probe scrub probe polish

Bookmark -  Del.icio.us | Furl It | Technorati | Ask | MyWeb | Propeller | Live Bookmarks | Newsvine | TailRank | Reddit | Slashdot | Digg | Stumbleupon | Google Bookmarks | Sphere | Blink It | Spurl

• International Test Solutions Announces Japan Branch Office and Appointment of Masahiro Sato as General Manager 2008-09-04
• International Test Solutions Appoints Jim Duvall as Vice President of Manufacturing 2008-08-28
• International Test Solutions Names Jerry Broz as Vice President of Applications 2008-06-25
• International Test Solutions Announces Asia Branch Office 2008-02-06