PRWeb The Leader Press Release Distribution
See How PRWeb Works

We're here to help 1-866-640-6397

Login Create Free Account


All Press Releases for August 28, 2008 Subscribe to this News Feed    
 

International Test Solutions Appoints Jim Duvall as Vice President of Manufacturing

Reno, Nevada based, semiconductor test company, International Test Solutions (ITS) appoints Jim Duvall as Vice President of Manufacturing.

Reno, NV (PRWEB) August 28, 2008 -- International Test Solutions, Inc. ("ITS") recently announced the appointment of Jim Duvall to the position of Vice President of Manufacturing. Mr. Duvall will oversee all facets of manufacturing, including the current production lines, as well as the development of several new products and associated processes.

"Jim broadens our excellent management team and allows us to focus even more intently on new product development and manufacturing improvements for our proprietary cleaning polymer lines," said Gene Humphrey, President of International Test Solutions. "With the rollout of several new product lines in the near future, Jim will be integral in our efforts to ensure smooth and cost-effective implementation of the required processes."

Mr. Duvall has over 15 years of industry experience that has included Engineering, Management and Executive positions at Furon / St. Gobain and Chemsultants International in the areas of materials production, development and technical sales with a focus on products used in semiconductor manufacturing and electronics assembly.

Jim has several patents and applications pending and has given numerous papers and presentations in the areas of industrial materials and adhesives. He earned his Master of Science Degree in Polymer Engineering from Case Western Reserve University.

About International Test Solutions, Inc. (ITS):
International Test Solutions provides non-destructive probe card cleaning products used by semiconductor manufacturers to remove debris and contaminants generated during wafer level and burn-in/test socket testing. By removing loose debris and adherent contaminants in-line, the quality of the testing data is improved, the test equipment downtime is reduced, throughput is increased and manufacturing yields are improved.

For more information about International Test Solutions, or this particular news article, please contact Tina Romero at (1) 775.284.9220 or sales @ inttest.net.

###

Post Comment:
Trackback URL: http://www.prweb.com/pingpr.php/Q291cC1Qcm9mLUNvdXAtU2luZy1QaWdnLVNpbmctWmVybw==

Technorati Tags

Bookmark -  Del.icio.us | Furl It | Technorati | Ask | MyWeb | Propeller | Live Bookmarks | Newsvine | TailRank | Reddit | Slashdot | Digg | Stumbleupon | Google Bookmarks | Sphere | Blink It | Spurl


Other Releases by this Member
OPTIONS
Printer Friendly Version
Download PDF Version
Download Reader Version
BlogThis
ShareThis
CONTACT INFORMATION
Tina Romero
International Test Solutions
775.284.9220
Email us Here
ATTACHED FILES

There are no multimedia files attached to this release. If this is your release, you may add images or other multimedia files through your PRWeb News Management Console.

ABOUT PRESS RELEASES
If you have any questions regarding information in these press releases please contact the company listed in the press release. Please do not contact PRWeb. We will be unable to assist you with your inquiry. PRWeb disclaims any content contained in these release. Our complete disclaimer appears here.
 
Close Move