Akrometrix Announces Akrometrix Studio Software: Its Next Generation Modular Metrology Solution for the Microelectronics Industry

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The release of Akrometrix Studio Software is a major milestone for semiconductor metrology. We have raised the bar for surface measurement applications with a single integrated platform solution. In this economic environment, only those who find new and better ways of validating their ideas and collaborating with their supply chain partners will survive.

Atlanta, GA (PRWEB) May 28, 2009

Akrometrix today announced the availability of Akrometrix Studio Software, its next generation software platform solution designed to measure and analyze substrates and components faster and in more detail. Akrometrix Studio Software offers optional modules that provide additional measurement techniques that are fully integrated such as Micro Fringe Projection for small form factor characterization and Digital Image Correlation for in-plane characterization and CTE calculation. For the first time, a fully integrated surface characterization platform is now available for the global electronics supply chain.

Akrometrix Studio Software is a modular metrology solution designed to help the global electronics industry address performance, reliability and yield loss. Akrometrix Studio Software provides high density data acquisition and analysis capabilities that can be used to address warpage related issues such as solder joint opens and shorts, package delaminating and silicon chip cracking.

"Our mission is to deliver innovative flatness characterization software solutions, hardware and analysis capabilities to the microelectronics industry," said Timothy Purdie, Akrometrix President and CEO. "The release of Akrometrix Studio Software is a major milestone for semiconductor metrology. We have raised the bar for surface measurement applications with a single integrated platform solution. In this economic environment, only those who find new and better ways of validating their ideas and collaborating with their supply chain partners will survive."

The new capabilities in Akrometrix Studio Software include:

• Studio Manager - integrated user interface
• Profile Generator - allows the creation of thermal profiles via mouse or numerical entry
• Surface Measurement - 1.4 million measurements now available in less than 2 seconds
• Thermal Profiler - Automated data collection with enhanced operator feedback
• Surface Analysis - Multiple 3D graph display and enhanced batch processing capability
• Micro Fringe Projection - small form factor surface characterization
• Digital Image Correlation - In-plane surface characterization and CTE calculation

Akrometrix Studio Software for the TherMoir頁XP and the Akrometrix Studio Software Upgrade for the TherMoir頓400 are available for immediate delivery and installation.

To download a PDF introduction about Akrometrix Studio Software please click the link below.

http://www.akrometrix.com/public/media/Akrometrix_Studio_Introduction.pdf

To request to speak with an Akrometrix Application Engineer please go to http://www.akrometrix.com and click on the 'Get information you can use right now' from leading experts' button on the homepage.

About Akrometrix
Akrometrix is the leading provider of modular metrology solutions for global microelectronics industry. Akrometrix TherMoir頡nd LineMoir頰roducts offer comprehensive flatness measurement and analysis capabilities for R&D and high volume applications. A pioneer in the temperature dependent measurement arena, Akrometrix equipment is utilized by 95% of the top 20 global semiconductor manufacturers. Founded in 1994, Akrometrix is based in Atlanta, Georgia USA with operations and partners located in all major microelectronics manufacturing regions around the world.

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