Columbia, MD (PRWEB) December 17, 2009
METTLER TOLEDO will be exhibiting at the American Association of Pharmaceutical Scientists’ Annual Meeting, AAPS 2010, in New Orleans, LA November 14-18, 2010. Visit Booth 612 at AAPS 2010 to see the latest particle size distribution technologies on display, including the C35 Atex which will be released in 2010.
During the 2009 AAPS Annual Meeting, METTLER TOLEDO presented Roller Compaction Process Optimization Using At-Line Particle Characterization, where the application of in situ particle characterization was demonstrated to map the design space and optimize a series of roller compaction runs while varying raw materials, flow rates, and roller compaction forces. In situ particle characterization allows formulators or engineers to detect process upsets such as segregation and directly link process control parameters to the particle distribution. This enables formulators to ensure consistent product performance. By designing a robust roller compaction process, formulators and engineers can ensure consistent downstream processing from dry granulation through tablet compression. For those who were not able to attend AAPS 2009, the Roller Compaction Process Optimization Using At-Line Particle Characterization presentation has been made available to view via On-Demand Webinar.
After purchasing Lasentec® in 2001, METTLER TOLEDO has become the world leader for inline particle/droplet size, shape, and count characterization.