OptimalTest Introduces New Capabilities for its Leading Optimal Enterprise Test Management Software

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New Utilization Platform Underscores Test as Strategic Management Tool; Broader Implementation of Outlier Detection, Wafer Map Inspector, and TTR Simulator add new Functionality to Realize Measurable Results and Enabling Semiconductor Companies to Achieve the “Optimal Enterprise”

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OptimalTest has led the industry in developing Advanced Adaptive Test software solutions

International Test Week - OptimalTest, the leader in Advanced Adaptive Test® and enterprise-wide test management and optimization software for the semiconductor industry, is introducing significant new capabilities and enhancements for a considerably more scalable and flexible “Optimal Enterprise” solution. OptimalTest continues to evolve the state-of-the-art in test management and provide additional automated expert processes and applications to establish test and test data as value-added strategic management tools.

The addition of OptimalTest innovative Advanced Adaptive Test® capabilities of the Optimal Enterprise solution will be demonstrated at the 41st annual International Test Conference (ITC), Nov. 2-4, held during International Test Week in Austin, Texas at the Austin Convention Center.

“OptimalTest has led the industry in developing Advanced Adaptive Test software solutions,” says Dan Glotter, founder and CEO of OptimalTest. “Now we are expanding the functionality so that companies have greater options for implementing and benefiting from the test management and optimization that the Optimal Enterprise solution provides, meeting both their current and future needs.”

More Comprehensive and Scalable, with Added Capabilities
Until OptimalTest introduced its Test Management Solution in 2006, the industry had access only to “point” solutions for yield management, outlier detection, and other test issues. The advent of OptimalTest’s comprehensive software – which addresses many of these test management and operational issues, including the effective use of capital equipment, in a solution that is agnostic to hardware, process, product and business models – provides semiconductor companies a greater range of capabilities based on innovations such as advanced adaptive test, with a high-degree of integration among them.

Now, with OptimalTest’s latest capabilities and enhancements, today’s value-added chain of semiconductor partners – the fabless, IDMs, foundries, and OSATs that work together in various global multi-enterprise configurations – can adopt the ideal solution for their business model and scale it quickly and easily to meet rapidly changing business needs, allowing them to keep pace with dynamic technologies, partners, applications and market forces. In addition, this enterprise-wide solution delivers highly reliable quality utilization and test data for informed decision-making across enterprise partners.

Debbora Ahlgren, OptimalTest‘s Vice President, Sales & Marketing, states, “We’re providing an alternative to traditional capital-intensive test investment and allowing companies to do much more than simply modify existing test strategies. OptimalTest is bringing the benefits of highly automated, expert rules based statistical process control – tools long employed by front-end semiconductor players — to the test operations, and we’re accomplishing it in an integrated fashion across semiconductor value-chain enterprises. In doing so, OptimalTest continues its leading role in fulfilling the promise of adaptive test.”

The Latest Solution Enhancements for Achieving the Optimal Enterprise
Building on its existing test management and optimization solution set, OptimalTest is introducing these new capabilities, available immediately and fully integrated with the expert rules system (OT-Rules2) and the business intelligence and visualization tool (OT-Portal), focused on further enabling the Optimal Enterprise :

Utilization Platform
An extremely robust and powerful application within the Optimal Enterprise solution that allows for effective capital asset management of test equipment and visibility into OEE (Overall Equipment Efficiency) with specific efficiency indicators. Utilization Platform is the initial offering of a major module planned for engineering use

  • Covers a wide variety of asset utilization categories, monitoring events and testers with analysis of inefficiencies
  • Fully customizable to meet individual organizations’ needs
  • High data integrity and completeness

Enhanced and Integrated implementation of Outlier Detection
Outlier Detection techniques, once the unique tool of automotive and medical device manufacturers, is becoming a prevalent tool even for communications devices as other device quality predictors fail. The new enhanced integrated implementation is available immediately.

  • Broadly integrated and implemented for more flexibility, as well as easier access and use
  • Algorithms for basic Outlier Detection (e.g., D-PAT) as well as Advanced Algorithms (e.g., NNR) are immediately available

Wafer Map Inspector
For assemblies whose die feature Unit Level Traceability (ULT), composite wafer maps can be visualized using Wafer Map Inspector. The ability to observe and analyze the quality of die and devices from data retrieved at final test using the familiar wafer map format can assist in the identification of process- or fab- related issues that have the potential to impact product quality and final yield.

  • View reconstructed (composite) wafer maps in the OT-Portal using the new Wafer Map Inspector for optimized engineering productivity
  • Full analysis of composite wafer maps from devices at final test is supported by Wafer Map Analyzer
  • Capabilities support identification of process trends where wafer data may not be readily available

TTR Simulation
The need to continuously reduce the Cost of Test without compromising the quality of test operations is of ever increasing importance. The Optimal Enterprise solution supports multiple techniques for managed cost of test, by simply and quickly simulating Advanced Adaptive Test algorithms on historical data.

  • Capabilities include Pass/Fail and Parametric algorithms, which are used separately or collectively
  • Supports rapid Time to Deployment of TTR
  • Fully integrated with the expert rules system (OT-Rules2) and the business intelligence tool (OT-Portal), TTR simulation is part of the OptimalEnterprise end-to-end TTR rules development and deployment solution

About OptimalTest
Established in 2005, OptimalTest provides comprehensive, scalable test management and optimization software based on advanced adaptive test. The company’s solution is unique for its breadth, incremental modularity, seamless connectivity and real-time and near-time capabilities. It allows adaptation and enhancement of test processes and operations through continuous automated learning, advanced adaptive test techniques and expertly culled data that is decision-ready, resulting in significant, measurable improvements in yield, test time reduction, reliability, and quality as well as reduced cost of test. OptimalTest has growing worldwide operations in Asia-Pacific, Europe and the United States. For more information, go to http://www.optimaltest.com.

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