Joseph Federico Speaks on Proper Electrical Testing at the DMSMS and Standardization Conference 2011

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Joseph Federico, Vice President and director of operations of NJ Micro Electronic Test Labs, spoke about proper testing for counterfeit electronics at the DMSMS conference recently concluded in Hollywood, Florida.

This is the primary reason why we held the lecture on proper electrical testing; to emphasize the importance of performing proper DC, AC functional and parametric testing. -- Joseph Federico

Joseph Federico Vice President and director of operations of NJ Micro Electronic Test Labs spoke about proper testing for counterfeit electronics at the DMSMS conference recently concluded in Hollywood, Florida.

“As exhibitors, we were proud to present our Mission: Imposter Counterfeit Component Test Program as well as to present a lecture on the proper electrical testing protocols that should be used in testing components for their full functional and parametric performance. These tests are invaluable in helping to detect counterfeit components,” said Joseph Federico.

Joseph Federico’s lecture was entitled “Proper Electrical Testing to Detect Counterfeit Components.” Its scope was to educate members of the electronics industry about the risks associated with performing only basic contact testing with simple counterfeit detectors as opposed to the preferred functional and parametric exercises required to properly test these suspect electronic components.

The objective of the conference was to “focus on significantly improved DMSMS and Standardization policies, procedures, guidance, and automated tools that optimize Warfighter materiel readiness, and includes activities required to attain this goal such as Value Engineering, Product Support and Total Life Cycle Management, Parts Management, and mitigating the Counterfeiting epidemic on parts, material, and materiel. To meet this objective our approaches to managing the ever-present obsolescence problem must be examined.” See the DMSMS website for a more details.

As an introductory message from the conference chair, director of the DMSMS Gregory E. Saunders outlined the importance of the conference objective by emphasizing that “the strategic goals of the Department of Defense (DoD) objective was to include increasing the efficiency and effectiveness of developing, producing, testing and sustaining systems so that required warfighter capabilities are available.”

He further went on to explain that “the conference agenda would provide insight into the current best practices in DMSMS, Standardization, Parts Management, Value Engineering, Counterfeit Detection and Reporting, Total Life Cycle Management, and several other DMSMS and Standardization processes and initiatives.”

The team at NJ Micro Electronic Testing participated in the Counterfeit Parts Control Plan Implementations, the DMSMS Tools and Services Program, as well as technical sessions and panels which included Institutionalizing Standard Practices, Defense Initiatives and their impact to DMSMS, Counterfeit Mitigation Strategies and Counterfeit Reporting.

“One of the key sessions which we felt was an asset to this conference was the Counterfeit Reporting Workshop which excellently illustrated some of the main differences between the various reporting tools,” said Joseph Federico. It also discussed processes and systems which increase the sharing of information enabling early detection and prevention of counterfeiting at all levels of the DoD supply chain.

“In our opinion this conference was one of the best opportunities for exchanging information between the audience and presenters,” Joseph Federico added.

On a different note, there was a major concern on behalf of the US Department of Defense on the potential cutback of electrical testing of electronic components.

The Military and Aerospace industry attendees and exhibitors had major concerns about the limited testing performed by a curve/contact tester versus the preferred DC, AC functional and parametric testing over the device temperature in uncovering counterfeit product” said Joseph Federico of NJ Micro Electronic Testing.

“This is the primary reason why we held the lecture on proper electrical testing; to emphasize the importance of performing proper DC, AC functional and parametric testing. Electrical testing provides a more thorough exercise in testing electronic component products to illustrate their accuracy and authenticity,” said Joseph Federico.

All of the workshops were extremely helpful in moving forward on improving organizational structures and improving DMSMS strategies for the future, Joseph Federico concluded.

Clifton, New Jersey based NJ Micro Electronic Testing provides a wide and diversified range of laboratory test and management services. NJ Micro Electronic Testing is equipped and staffed to be a single source provider for all testing needs.

For more information about testing electronic components, see Joseph Federico's blog at: http://josephfedericonj.wordpress.com/.

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Marc Goldberg
NJMET
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