RFID Journal LIVE! 2012 to Feature Two New Item-Level Retail and Apparel Workshops

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The tenth annual conference and exhibition will educate attendees on how to deploy RFID to track individual items within the retail and apparel industries.

RFID Journal announced today that two new item-level retail and apparel workshops, presented in partnership with the Voluntary Interindustry Commerce Solutions (VICS) Association, will be offered to attendees at RFID Journal LIVE! 2012 (http://www.rfidjournalevents.com/live), the world's premier conference and exhibition focused on radio frequency identification (RFID) and its many business applications.

This year's LIVE! event will be held on Apr. 3-5, 2012, at the Walt Disney World Swan and Dolphin resort, located in Orlando, Fla. The two workshops—the Item-Level Retail and Apparel Workshop and the Item-Level Supplier Workshop—will educate visitors about the use of RFID for tagging at the item level within the retail and apparel sectors.

“Companies such as American Apparel, JCPenney and Wal-Mart have proved that RFID can deliver significant benefits to retailers,” said Mark Roberti, RFID Journal's founder and editor. “New research shows it can also benefit suppliers, so we are pleased to work with VICS to offer education to both retailers and suppliers.”

Retailers worldwide are employing RFID to track individual items, improving inventory accuracy and enabling them to have products on shelves when customers want to buy them. During the Item-Level Retail and Apparel workshop, attendees will hear where the benefits are, and how to achieve them. Additionally, visitors will receive an update regarding the VICS Item Level RFID Initiative (VILRI), which is helping to develop standard ways of deploying the technology, as well as best practices.

The Item-Level Supplier Workshop is designed to quickly bring apparel manufacturers new to RFID up to speed, by providing all of the information necessary to begin tagging individual garments, including tagging options, managing serialized data and more.

“The VICS Item Level RFID Initiative is collaborating with GS1 US to utilize EPC best practices in the retail value chain,” said Joe Andraski, VICS' CEO. “We are also seeking to educate retailers and suppliers about the potential benefits, so we are excited about working with RFID Journal to share best practices with companies attending LIVE! 2012.”

The event will also feature a Retail and Apparel conference track, in which attendees will hear sessions presented by leading end users in their industry. Topics to be covered will include reducing stocks via RFID, increasing sales with an RFID-enabled loyalty program and an analysis of RFID performance within retail stores. In addition, clothing manufacturer and retailer American Apparel will present a session detailing how RFID-enabled stores have produced a quick return on investment (ROI) for the company. There will also be a Retail Apparel Pavilion, featuring RFID solutions focused on this market.

What's more, LIVE! 2012 will feature four industry-specific and four level-of-expertise conference tracks, as well as nine in-depth preconference seminars and workshops, fast-track training, the RFID Journal Awards, and two co-located events—IEEE RFID 2011 and The AIDC 100: RFID and Bar-Code Co-existence. Additionally, the conference will offer exhibits and demonstrations conducted by the industry's leading technology firms. For more information, visit http://www.rfidjournalevents.com/live.

About RFID Journal
RFID Journal is the leading source of news and information regarding radio frequency identification (RFID) and its many business applications. Business executives and implementers depend on RFID Journal for up-to-the-minute RFID news, in-depth case studies, best practices, strategic insights and information about vendor solutions. This has made RFID Journal the most relied-upon and respected RFID information resource, serving the largest audience of RFID decision makers worldwide—in print, online and at face-to-face events. For more information, visit http://www.rfidjournal.com.


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