Microscan to Instruct Machine Vision Lighting and Traceability Courses at Automate 2013

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Microscan announces that its Machine Vision Promoter, Dr. Jonathan Ludlow, will instruct an educational course on “Advanced Machine Vision Lighting” as part of the Certified Vision Professional Program at Automate 2013.

Microscan Barcode, Machine Vision and Lighting Solutions

Microscan Barcode, Machine Vision and Lighting Solutions

Microscan, a global technology leader in barcode, machine vision and lighting solutions, announces that its Machine Vision Promoter, Dr. Jonathan Ludlow, will instruct an educational course on “Advanced Machine Vision Lighting” as part of the Automated Imaging Association (AIA)’s Certified Vision Professional Program. The CVP program provides educational courses and skills testing for machine vision professionals at the AIA’s conferences and tradeshows, including Automate 2013, which will take place January 21-24, 2013 at McCormick Place in Chicago, IL.

Proper lighting is essential to the success of any machine vision application, but can be difficult to achieve in configurations that include large objects, curved surfaces, or otherwise hard to light geometries. In “Advanced Machine Vision Lighting”, Dr. Ludlow will guide users in designing lighting for complex applications such as these, and cover topics including color, polarized light, strobing, and new developments in lighting control. In the course of the presentation, attendees will learn to improve lighting engineering skills by taking an analytical look at everyday images in movies, TV, and photo journalism. The certification program course will take place at Automate 2013 from 11:00 AM to 1:00 PM on Monday, January 21, 2013.

Additionally, Dr. Ludlow will present a lecture at the co-located ProMat 2013 show on Tuesday, January 22 from 10:00 to 10:45 AM. Titled “Unit Level and Product Traceability using Data Matrix Codes – Benefits, Applications and Trends” this presentation will outline the value of providing individual components a unique identity so they can be tracked and traced through the entire manufacturing and assembly process. Direct part marking, reading, and verification technology will also be discussed during this lecture, part of the ProMat Educational Conference.

Course instructor Dr. Jonathan Ludlow, Machine Vision Promoter, has been instructing machine vision lighting and technology overview courses for Microscan since 2008. He has been active in machine vision product development for many years, has authored papers on the application of machine vision in semiconductor packaging and electronic assembly, holds several patents relating to inspection systems, and is a regular speaker at machine vision symposia.

For information on Microscan and machine vision lighting, visit http://www.microscan.com or stop by Booth #425 at the Automate 2013 show. Complimentary passes to both Automate and ProMat 2013 are available here: http://info.microscan.com/2013Automate_ComplimentaryPass.html.

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Cathy McBeth
Microscan Systems Inc
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