CARDIFF, UK (PRWEB) March 12, 2013
SPIE Optical Metrology, the field’s premier conference in Europe for scientists, engineers, researchers and applications and product developers, will be held 13-16 May at the International Conference Centre Munich with the World of PHOTONICS Congress.
Among featured talks, Wim Coene (ASML Research) will give a plenary lecture on “Challenges in optical metrology for photo-lithography.”
Optical Metrology covers new optical principles and systems for metrology, videometrics and machine vision with applications in industrial design, production engineering, process monitoring, maintenance support, biotechnology, vehicle navigation, multimedia technology, architecture, archaeology and arts. Conference topics are:
Symposium Chairs are Wolfgang Osten, Univ. Stuttgart; Karsten Buse, Fraunhofer-Institut für Physikalische Messtechnik; and Andrew Moore, Heriot-Watt Univ.
Networking opportunities for students will include a leadership workshop for SPIE Student Chapter officers featuring lecturer Jean-luc Duomont (Principiæ), and a luncheon for SPIE Students and Fellows.
More information is on the conference website: http://www.spie.org/om.
Accepted papers will be published in the SPIE Digital Library as soon as approved after the meeting, and in print volumes and digital collections.
Sponsored by SPIE Europe, Optical Metrology is part of the biennial World of PHOTONICS Congress along with other conferences organized by WLT (German Scientific Laser Society/Wissenschaftliche Gesellschaft Lasertechnik), EOS (European Optical Society), OSA, IEEE Photonics Society and EPS (European Physical Society).
SPIE is the international society for optics and photonics, a not-for-profit organization founded in 1955 to advance light-based technologies. The Society serves nearly 225,000 constituents from approximately 150 countries, offering conferences, continuing education, books, journals, and a digital library in support of interdisciplinary information exchange, professional networking, and patent precedent. SPIE provided $3.3 million in support of education and outreach programs in 2012.