Clifton, NJ (PRWEB) June 24, 2013
Joseph Federico, NJ MET VP and Director of Operations, announced the awarding of the NJ MET annual scholarship to Kevin Malhorta, a senior at Wayne Hills High School, Wayne, NJ. The annual scholarship’s goal is to recognize students who excel in the studies of science and technology.
“As a company we understand the need to promote the study of engineering, science and technology and recognize students who excel in these fields,” said Joseph Federico from NJ MET’s headquarters in Clifton, NJ.
Kevin Malhorta was presented with a savings bond and a plaque by Michael Giannini, a Wayne Hills alumnus and NJ MET representative. The scholarship was created in 2001 by Joseph Federico. It is presented each year to a NJ high school graduate. Last year, it was given to a graduate of Wayne Valley High School.
“We are proud to present this scholarship for the 13th consecutive year,” said Joseph Federico, a current Wayne, NJ resident.
“It was a pleasant surprise to be picked for the scholarship and an honor to receive it from a Wayne Hills High School alumnus,” said Kevin Malhorta. Kevin will be studying Computer Engineering at Virginia Tech this fall.
NJ MET, a Clifton NJ based company, is an industry leader in testing electronic components. NJ MET’s Mission Imposter® Risk Mitigation Counterfeit Component Detection Program is a multi-step inspection and testing process used by engineers and engineering assistants to prevent counterfeit product distribution.
For more information on participating in the annual NJ MET Inc. scholarship, or any corporate charity cause, please contact Joseph Federico, at (973) 546-5393 at NJ MET headquarters in Clifton, NJ or visit Mr. Federico's website. Please visit the NJ MET website for information about NJMET's testing and professional services.
About NJ MET:
NJ MET provides professional electronic component testing to the commercial, military, aerospace, industrial and automotive fields worldwide. Its state of the art Mission Imposter® Risk Mitigation program helps identify counterfeit or cloned products.