Park Systems Introduces Park XE7-CR Affordable, Research-Grade AFM for Research and Education

Park Systems, a leading manufacturer of atomic force microscopy (AFM) products announces the debut of the Park XE7-CR, designed for university classrooms, research & scientific studies, fully bundled with classroom teaching material including an AFM primer book (50 copies), a set of video files and training manuals for curriculum use. Park XE7-CR is the first research grade AFM priced and ready for classroom use.

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Park Systems XE7-CR

"Park AFM meets our rigid requirements for accurate measurements at the highest nanoscale resolution at a price we can afford."Dr. Gwo-Ching Wang, Professor at Rensselaer Polytechnic Institute

Santa Clara, CA (PRWEB) August 06, 2014

Park Systems, a leading manufacturer of atomic force microscopy (AFM) products announces the debut of the Park XE7-CR, designed for university classrooms, research & scientific studies. Park XE7-CR is fully bundled with classroom teaching material including an AFM primer book (50 copies), a set of video files and training manuals for curriculum use. Modeled after the highly successful Park XE7, the most affordable, research-grade AFM world-wide, Park XE7-CR provides academic researchers with a cost-effective solution using Park’s proprietary technology, without compromising quality or functionality, a key distinction from conventional classroom AFMs.

The explosive advancement of nano-scale technologies is impacting every existing industrial sector and universities are playing a key role in the development and commercialization of these Nano Science applications. Universities are tasked with preparing future NanoScientists for future careers which includes the appropriate use of equipment such as AFM. Park Systems developed XE7-CR to meet the needs of universities by offering a low priced research grade AFM that has excellent classroom tools and all the power and accuracy available for scientific research needs. Park XE7-CR is the first research grade AFM priced and ready for classroom use.

“We continue to set new standards of excellence, beating the competition, with our new technology and high accuracy in AFM imaging and measurements,” says Keibock Lee, President of Park Systems. “Park XE7-CR is the most affordable research-grade AFM product, a significant milestone that transforms the next generation of AFM technology for Universities and Scientific Research and the ultimate testament of our commitment to enabling more researchers and scientists at our leading academic institutions to achieve the most accurate nanoscale results at an unbeatable price.”

Park XE7-CR was designed to overcome the limitations currently available for universities seeking AFM systems. In the past, AFM’s for teaching were low cost but not suited to publish papers for scientific journals and the AFM’s for research were too costly for curriculum use and were not equipped for classroom use. Park XE7-CR meets both needs, as an AFM classroom teaching tool and also for producing the highest quality research, an option that is affordable without sacrificing quality.

Dr. Gwo-Ching Wang, Professor at Rensselaer Polytechnic Institute, the oldest technological research university in the nation, uses Park XE7 in lab sessions of experimental physics course, as well as for research at their state-of-the-art Nanotechnology and Advanced Materials Lab. Eight former and current students of her at RPI have received over 10 national graduate student awards [e.g., AVS (American Vacuum Society), MRS (Material Research society), and PEC (Physical Electronics Conference)].

“Our students require advanced research microscopy equipment to integrate into course learning and research methodology that can be applied to the real world,” comments Dr. Wang, “We have purchased three of the Park Systems Atomic Force Microscopes in the past, and we have added this latest one for our classrooms and research here at RPI because it meets our rigid requirements for accurate measurements at the highest nanoscale resolution at a price we can afford.”

Park XE7-CR also comes with an antivibration isolation table, and acoustic enclosure to free from floor shakes and room noises that affect measurements at nanoscale level, enabling accurate operation.
The advantages of Park XE-CR for research-grade AFM underline the flat and orthogonal XY scan achieved by Crosstalk Elimination (XE) where the two independent, closed-loop XY and Z flexure scanners are used for sample and probe tip. Park XE7 also features True Non-Contact Mode™ for longer tip lifespan with minimized sample damage or modification.

About Park Systems
Park Systems is a world-leading manufacturer of atomic force microscopy (AFM) systems with a complete range of products for researchers and industry engineers in chemistry, materials, physics, life sciences, semiconductor and data storage industries. Park’s products are used by over a thousand institutions and corporations worldwide. Park’s AFM provides highest data accuracy at nanoscale resolution, superior productivity, and lowest operating cost thanks to its unique technology and innovative engineering. Park Systems, Inc. is headquartered in Santa Clara, California with its global manufacturing, and R&D headquarters in Korea. Park’s products are sold and supported worldwide with regional headquarters in the US, Korea, Japan, and Singapore, and distribution partners throughout Europe, Asia, and America. Please visit http://www.parkafm.com or call 408-986-1110 for more information.


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