New Live Webinar Highlights Using TOPEM® to Understand Frequency-Dependent Effects

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TOPEM®, a modern thermal analysis technique, allows temperature-dependent and time-dependent effects on materials to be separated. A free webinar from METTLER TOLEDO will explore how TOPEM works and how it is being applied for easier, more robust and accurate thermal analysis.

TOPEM Webinar

TOPEM allows characterization of effects that shift with frequency.

TOPEM allows characterization of effects that shift with frequency and easily distinguishes them from effects that show no frequency dependence.

METTLER TOLEDO is pleased to present a new live webinar, Temperature Modulated DSC Techniques (TMDSC), on Thursday, June 1st, 2017. The English-language presentation, offered three times to allow participation from around the globe, will discuss the basic premise and use of TOPEM, an advanced multi-frequency temperature-modulation technique.

TMDSC is widely used in industrial and university research laboratories to separate overlapping temperature-dependent and time-dependent effects on materials. However, until now, methods have typically overlaid the isothermal temperature or heating ramp with a sinusoidal temperature modulation of just one single frequency.

TOPEM uses a multi-frequency approach. At its most basic level, this method overlays the isothermal or ramped temperature with a time series of stochastic (random) temperature pulses of different durations. Advantages include:

  •     One measurement – properties as a function of time and temperature over a wide frequency range
  •     Pulse-response cp determination – accurate quasi-static heat capacity determination
  •     High sensitivity and high resolution – effective measurement of low-energy transitions and/or close-lying temperature-dependent effects
  •     Separation of reversing and non-reversing processes – heat capacities can be determined with unrivaled quality even when effects overlap
  •     Extended PEM technique – eliminates instrumental influences and extends the measurable frequency range

In short, TOPEM allows characterization of effects that shift with frequency and easily distinguishes them from effects that show no frequency dependence. This greatly simplifies results-interpretation for samples with overlapping effects.
TOPEM’s effectiveness will be explored using representative application examples. The presentation will conclude with a Q&A, so attendees can have their most pressing TOPEM questions answered by METTLER TOLEDO experts.

Click here to register for the free presentation and learn more about the role of TOPEM in highly accurate materials characterization.

About METTLER TOLEDO
METTLER TOLEDO is a leading global manufacturer of precision instruments. The Company is the world’s largest manufacturer and marketer of weighing instruments for use in laboratory, industrial and food retailing applications. The Company also holds top-three market positions for several related analytical instruments and is a leading provider of automated chemistry systems used in drug and chemical compound discovery and development. In addition, the Company is the world’s largest manufacturer and marketer of metal detection systems used in production and packaging. Additional information about METTLER TOLEDO can be found at http://www.mt.com.

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Urs Joerimann
METTLER TOLEDO
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