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The Museum At Fit Presents American Style: A Two-Day Symposium Featuring Designers, Scholars, Authors, and Curators Discussing Fashion of the Americas

The Museum at FIT's presents American Style, its eighth annual symposium, held in conjunction with the exhibition American Beauty: Aesthetics and Innovation in Fashion. Designers, scholars, authors, and curators will discuss fashion of the Americas and explore themes ranging from the diversity of the American fashion industry to the unique characteristics of New York fashion. Speakers include designers Maria Cornejo, Christian Cota, and Yeohlee Teng; Nina Garcia, fashion director of Marie Claire, and New York Times style writer David Colman.

(Vocus/PRWEB ) October 7, 2009 --

WHAT: American Style, The Museum at FIT's eighth annual symposium, held in conjunction with the exhibition American Beauty: Aesthetics and Innovation in Fashion. Designers, scholars, authors, and curators will discuss fashion of the Americas and explore themes ranging from the diversity of the American fashion industry to the unique characteristics of New York fashion. The symposium will also feature conversations with some of the most innovative American designers working today. Speakers include:

 
  • Van Dyk Lewis: Hip-hop Fashion: The Psycho Mind and Body Drop
  • David Colman: Prep-posterous: How history, mythology, race and fashion have clashed and colluded to create today's 'Prep Revival'
  • Pamela Golbin: A French View of American Fashion
  • Nina Garcia, Maria Cornejo, and Christian Cota: Latin America and Fashion
  • Caroline Milbank: The Origin of the American Look
  • Kohle Yohannan: The Small Town Girl and The Femme Fatale: Claire McCardell & Valentina
  • Yeholee Teng: In Conversation with Susan Sidlauskas

WHEN: Friday, December 4 and Saturday, December 5, 2009 9:30 am-5:30 pm

WHERE: Fashion Institute of Technology

 
  • Morris W. and Fannie B. Haft Auditorium
  • Marvin Feldman Center (C Building)
  • 27th Street between Seventh and Eighth Avenues

COST: General public: $100 for both days. (No single-day registrations.)
 
  • Free to all students everywhere, thanks to the Coby Foundation.
  • Free to members of the Couture Council and FIT faculty and staff with ID
  • 10% discount to members of the Cooper Hewitt, National Design Museum

REGISTER: Registration is required. Visit www.fitnyc.edu/museum to register.
Walk-ins admitted, space permitting
Visit www.fitnyc.edu/museum or museuminfo (at) fitnyc (dot) edu or call 212 217.4558

MEDIA: Call 212 217.4700 or email press (at) fitnyc (dot) edu.

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Cheri Fein
Fashion Institute of Technology
212-217-4700
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