Ann Arbor, MI (PRWEB) September 8, 2006
Coherix®, Inc., Ann Arbor Michigan, has announced the availability of the ShaPix® Surface Detective™ family, a revolutionary innovation in its product line of high-definition surface defect detection and metrology systems. Previous-generation Shapix systems have been successfully deployed in automotive powertrain and other manufacturing plants and first-tier suppliers of automotive and other precision-machined parts for several years.
With technical roots dating back to the original implementation of practical of holography by Emmett Leith in Ann Arbor, Michigan, the Coherix® ShaPix® Surface Detective™ now provides comprehensive high-definition 3-D surface defect inspection and metrology at the micron level in a single plant-floor gauge. Now manufacturers, integrators and users of machine tools, machining centers, drilling and boring systems and other precision surface forming equipment can completely verify and measure their processes and operations to meet 21st century micron-level requirements. The Shapix Surface Detective will operate in the metrology lab, near the line, or in-process.
Designed and manufactured by an interdisciplinary team of holographic, optical electronic, software and mechanical engineers with 4 decades of world-leading optical non-contact gauging experience, the Shapix Surface Detective delivers results far beyond the slow and sparse data from traditional probe and stylus technologies for checking and measuring the dimensional correctness of precision machined parts and assemblies. Among the many unique values of the Shapix Surface Detective to manufacturers is the immediate process performance visibility provided by the full-color-coded 3-D “height map” and “defect location map” imagery that the Shapix Surface Detective delivers. This actionable information empowers manufacturing floor operators and supervisors with the instantly visual understanding they want and need to accomplish specific machine and process adjustment and control.
In less than 1 minute, the Shapix Surface Detective collects processes and displays up to more than 4 million points of interest on surfaces as large as 300 mm x 300 mm. Much larger surfaces are also measured when desired by accurate software merging of individual 300mm x 300mm surface views. The system displays the dimensional characteristics of the surface to every manufacturing floor individual requiring the information. In addition, specific defect and metrology results are sent to plant systems via the plant local area network when desired. The Shapix Surface Detective measures global and local flatness, waviness, the presence, location, and diameter of holes, detects the existence of pores and other specific defects, and determines the relative positions and orientations of multiple surfaces to measure parallelism, dimensional thickness variation, wedge, and squareness of multiple surfaces on a part or assembly.
The earlier generations of Shapix have repeatedly proven their ability to speed up product development, accelerate process launches and deliver major cost savings in production use by reducing spillages and detecting defects in machining processes at the point where they occur. This early and comprehensive detection and measurement prevents faulty parts from being fed forward into later expensive assembly operations.
Technical information, applications illustrations and product detailed specifications for the Shapix Surface Detective will be presented at the IMTS in collaboration with Control Gaging Inc. at their booth, location B7126. Additional information is available from Coherix at 3980
Ranchero Drive, Ann arbor, MI 48108, Tel.734-922-4061