The event will provide updates on the development of SAE standards, a look at the state-of-the-art for counterfeit detection and verification, and supply chain management techniques to reduce risk.
Warrendale, Pa. (PRWEB) November 20, 2013
Media registration is open for the SAE 2013 Counterfeit Parts Avoidance Symposium – South, which will be held Tuesday, Dec. 10, at the DoubleTree DFW Airport North.
The event will provide updates on the development of SAE standards, a look at the state-of-the-art for counterfeit detection and verification, and supply chain management techniques to reduce risk. In addition to the presentations, the speakers will close the program with a lively panel discussion and answer all the questions you have about counterfeit mitigation. The content of this program will be geared toward the needs of the electronics procurement professional.
The organizers of the program include the Chair of the SAE G-19 Counterfeit Parts Standards committee, Phil Zulueta, and SAE G-19 committee members Henry Livingston, Dr. Diganta Das, Sultan Lilani, Kevin Sink, Keith Gregory, and Chuck Amsden.
The symposiums is sponsored by leading electronics distributors TTI, Inc., Mouser Electronics and Sager Electronics.
For more information about the event, contact James Sherman (+1 724-772-4034), Darlene Waychoff (+1 724-772-7165) or Brandie Schandelmeier (+1 724-772-7191).
To request media credentials, email pr(at)sae(dot)org or call 1-724-772-8522.
SAE International is a global association committed to being the ultimate knowledge source for the engineering profession. By uniting over 138,000 engineers and technical experts, we drive knowledge and expertise across a broad spectrum of industries. We act on two priorities: encouraging a lifetime of learning for mobility engineering professionals and setting the standards for industry engineering. We strive for a better world through the work of our charitable arm, the SAE Foundation, which helps fund programs like A World in Motion® and the Collegiate Design Series™.