Santa Clara, CA (PRWEB) July 01, 2013
Park Systems, Inc., a leader in atomic force microscopy (AFM), is hosting a SemiconWest Reception in San Francisco on Wed. July 10, 2013 at the Hotel Palomar from 11:30 am -2:30pm. At the luncheon, attendees will get an opportunity to hear directly from Park experts about the latest cutting edge breakthroughs in nanotechnology AFM solutions for failure analysis and quality assurance,while they enjoy the fine lunch at the acclaimed Fifth Floor restaurant in the heart of downtown San Francisco.
Showcased at the SEMICON reception arethree new AFM design features: automatic defect review (ADR), high-resolution 3D sidewall metrology, and advanced electrical measurements for failure analysis delivered by AFM’s leading manufacturer Park Systems. Park dominates the AFM hard disc market with a 90% market share due primarily to their ability to reach beyond current standards and produce products with advanced design features that customers require in today’s competitive environment.
“We are excited to present this opportunity at SEMICON West to share valuable information about the advancements Park has pioneered in nanotechnology”, explains Keibock Lee, President Park Systems. “We strive to consistently create value for customers by enhancing our products with features that meet themost demanding requirements in AFM for performance and results.”
Those attending the luncheon will get an overview of the new AFM technology while dining at one of San Francisco’s premier restaurants in a near walking distance from the Semiconshow. To register for the reception, just go to http://us.parkafm.com/semicon or contact GeraldPascual at Gerald(at)parkafm(dot)com or call 408-986-1110.
At this year’s SEMICON 2013 Show, Park is introducingPark NX HDM, automatic defect review and sub-angstrom surface roughness atomic force microscopy (AFM) system, for the semiconductor and disk storage industry. It is an automatic defect review AFM that speeds up and improves the way defects in substrates and media are identified, scanned, and analyzed. Furthermore, Park is showcasing Park NX20, the next generation AFM for failure analysis.
“Technology leaders in the semiconductorand hard disk industry have chosen Park Systems as their AFM solutions partner to enable next-generation device design and manufacturing,” said Dr. Sang-il Park, the founder and CEO. “Park NX-HDM ensures rapid alignment and performance of its automated AFM solutions with the specific requirements of its customers, attaining the highest resolution AFM in the world with the lowest gauge sigma value for repeatability and reproducibility.”
To hear more about Park’s AFM products, please visit Park at SEMICON West Booth 2131 and register today to attend the exciting SEMICON West Park reception on July 10.
To register for the SEMICON 2013 Reception and luncheon at the award winning Fifth Floor restaurant, visit: http://us.parkafm.com/semicon or contact Gerald Pascual at Gerald(at)parkafm(dot)com or call 408-986-1110. RSVP at rsvp(at)parkafm(dot)com.
About Park Systems
Park Systems is a world leading manufacturer of atomic force microscopy (AFM) systems with a complete range of products for researchers and industry engineers in materials research, physics, bio-sciences, semiconductor and data storage industries. Park’s products are used by over a thousand of institutions and corporations worldwide. Park’s AFM provides highest data accuracy at nanoscale resolution, superior productivity, and lowest operating cost thanks to its unique technology and innovative engineering. Park Systems, Inc. is headquartered in Santa Clara, California with its global manufacturing and R&D headquarters in Korea. Park’s products are sold and supported worldwide with regional headquarters in the US, Korea, Japan, and Singapore, and distribution partners throughout Europe, Asia, and America. Please visit http://www.parkafm.com or call 408-986-1110 for more information.