All Angles: The New Nanostructure Analyzer SAXSpace

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Anton Paar introduces SAXSpace, a modular nanostructure analyzer as precise and swift as the company’s prior solutions, yet furthered by unique new features to offer users far more application options and considerably simplified handling.

Whether at small angles, wide angles or at grazing incidence: the quality of X-ray scattering measurements hinges on the smart collimation of the employed X-rays. SAXSpace gives users more collimation choices than any other comparable system: The system’s SmartSAXS feature enables both line and point collimation – optionally even at once, with two beam lines connected to the same X-ray source.

Following up on the concept of versatility, SAXSpace now offers extended TrueSWAXS functionality: users can precisely analyze their samples’ overall nanostructure up to 200 nm as well as their crystal lattice at the atomic level below nanometer size – by performing continuous SAXS and WAXS measurements. These measurements can be run simultaneously, without any need to re-align the system.

SAXSpace particularly stands out for its ease of use. In older systems, the alignment of components with the X-ray beam is usually complex and time-consuming. SAXSpace offers an unprecedented solution to this issue: based on its TrueFocus feature, the system aligns itself automatically. Even seasoned SAXS operators will breathe a sigh of relief at the thought of quick and easy push-button alignment.

For further information contact Gerd Langenbucher: Tel (804) 550-1051;
Email: gerd.langenbucher(at)anton-paar(dot)com

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Kristen Hangey
Anton Paar USA
+1 (800) 722-7556 118
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Gerd Langenbucher
Anton Paar USA
800-722-7556 126
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since: 01/2010
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