Santa Clara, CA (PRWEB) August 29, 2013
Park Systems, a leader in Atomic Force Microscopy (AFM) since 1997 announced today their first AFM image contest. Scientists, engineers, researchers and others who work with AFM are invited to submit their favorite AFM image for consideration. Twelve winners will be selected to receive prizes and appear in the Park Systems 2014 calendar. Each of the twelve selected winners who appear in the calendar will have an image caption and credit under image, identifying the winning researcher. Additionally, the individual who submits the best image will receive an iPad Mini, three runners will each receive a Kindle Fire and remaining finalists will receive a gift card.
“At Park, we consistently create value for customers by enhancing our products with features that produce the best quality AFM images and measurements,” commented Keibock Lee, Park Systems President. “We are excited to invite AFM users to select their best images which we will showcase in our 2014 calendar, demonstrating how today’s advanced AFM technology produces images with outstanding quality and visual appeal for industry’s most interesting applications.”
The winning images will be selected by a team of pre-selected judges from Park Systems based on any of the following three criteria: Image Quality, Visual Appeal, and Highly Interesting Application. Entries can be submitted via internet to contest(at)parkafm(dot)us between Aug 29 and Oct 15, 2014 and the images selected will be notified on Nov 1, 2013. For the complete guidelines, see below.
Park offers a suite of AFM products to suit your specific needs. This year, Park Systems introduced Park XE7, the scientific industry’s most affordable, research-grade AFM with innovative design features. Specially developed to achieve the most accurate nanoscale results, Park XE7sets a new standard for the next generation of AFM technology for research. Park XE-3DM is an automated industrial AFM for high-resolution 3D metrology, capable of imaging the most challenging structures such as soft photoresists and 3D multilayer topologies. For more about Park Systems complete line of AFM products, go to http://www.parkafm.com.
About Park Systems
Park Systems serves its customers by providing a complete range of AFM solutions including AFM systems, options and software, along with global service and support. Park Systems is the leading nanotechnology solutions partner for nanoscale measurements and systems for both research and industry. The product line of Park Systems reflects its focused strength to help customers achieve the metrology performance that meets the needs and requirements of present and future applications. Since improvements in nanometrology are key to enabling tomorrow's research, analysis, processing and product manufacturing, the innovative technology and market leadership of Park Systems in the field of nanometrology will remain as the core competence and market driving force of its future business. Park’s manufacturing and engineering facilities are located in Suwon, South Korea. Global sales and service offices are located throughout the U.S., Japan, and Singapore. For more information, visit http://www.parkAFM.com.
Park Systems AFM Image Contest Rules Terms:
Park Systems 2013 AFM Image Contest begins Aug 29, 2013 and ends Oct 15, 2013, at 5:00 PM Pacific Standard Time (PST). By submitting an entry, each contestant agrees to the rules of the contest.
Who may enter:
This contest is open to all engineers, scientists, researchers and others who work with AFM and who are not employed by Park Systems. The contest is not limited to AFM developed by Park Systems and is open to all AFM submissions.
What to enter:
Contestants can enter their best AFM image for consideration in the following areas:
1. Outstanding image quality
2. Visually appealing
3. Highly interesting application
The winners will be selected based on one or more of these qualities. The selection of winners is subject to the judges’ interpretation. A panel of judges will be selected from Park’s team of executives, scientists and product development engineers.
To be considered, submissions must be sent via e-mail to contest(at)parkafm(dot)us to Park Systems by Oct 15, 2013. Each entry must be identified with:
1. About you:
a. Name, title and organization or person making the submission
2. About the image:
3. About the scanning
a. Equipment model name
b. Tip utilized
c. Date of acquisition
4. Attach the image
a. Tiff or Jpeg (.tiff or .jpg)
Digitally or otherwise enhanced or altered images will not be accepted. If the judges determine that an image has altered his or her image, they reserve the right to move the image to disqualify it.
How to enter:
Please submit images and requested information via e-mail to contest(at)parkafm(dot)us.
All entries must be received through the Park Systems web site by 5pm Pacific Time on Oct 15, 2013.
Judging of the annual contest will be conducted by a pre selected team at Park Systems. Winning images will be announced on Park Systems Web site on Nov 1, 2013.
Park Systems will notify the winners via the contact information provided at the time of entry. We will select 12 winners who will all appear in the Park Systems 2014 calendar. In addition the judges will pick from the top 12 winners 3 runners up and one grand prize winner. The grand prize winner will receive an iPad Mini and the 3 runners up will each receive a Kindle Fire. The 8 finalists will each receive a $50 gift card. All winners will be credited and recognized in the Park Systems 2014 Calendar. Winners will be notified of their status by Oct 29, 2013 and will appear on our web site on Nov 15, 2013.
Prizes: Park Systems will award 12 prizes, as follows:
Grand Prize: iPad Mini and Front Cover of Park Systems 2014 Calendar
Runner Up Winners:
The three runners up will each receive a Kindle Fire and appear in the Park Systems 2014 Calendar.
Finalists: Eight finalists will each receive $50 gift cards and appear in the Park Systems 2014 Calendar.
Note: Each of the twelve selected winners who appear in the calendar will have an image caption and credit under image, identifying the winning institution and individual who submitted.