Boulder, CO (PRWEB) May 02, 2014
The 3rd Seminar on Surface Metrology for the Americas will be held at the Albuquerque Marriott Hotel in Albuquerque, New Mexico.
Tutorials cover two broad topics – Measurements and Multiscale Analysis. Tutorial topics include surface metrology and texture, interferometry, optical surface metrology, calibration of surface metrology instruments, spatial wavelengths and optical surfaces, use of filters in surface topography and corrosion monitoring investigations. In addition, there will be a special tutorial on surface analysis.
Tutorial speakers are prominent scientists and industry leaders representing a range of different specialties. François Blateyron, Digital Surf; Dr. Christopher Brown, Worcester Polytechnic Institute (WPI); Xavier Colonna de Lega and Mike Schmidt, Zygo Corporation; Claudiu Giusca, National Physical Laboratory (NPL); Dr. Matt Novak, Bruker-Nano, Stylus and Optical Metrology; Eric Oberg, Mitutoyo America Corporation; Dr. Suresh Ramasamy, Hutchinson Technology; Dr. Deepak Sharma, Bruker-Nano; Dr. Hy Tran, Sandia National Laboratories and Dr. Ted Vorburger, National Institute of Standards and Technology, (NIST).
The Seminar includes an exhibition area, where exhibitors will be providing information on their products and services. Exhibitors for the event are: Alicona Corporation, Digital Surf, FRT of America, LLC, Keyence Corporation and KLA-Tencor.
2995 Wilderness Place, Suite 107
Boulder, CO 80301
303-440-3339 | info(at)ncsli(dot)org