Vancouver, BC Canada (PRWEB) July 08, 2014
Quartz Imaging Corporation will be showcasing its products at the annual M&M (Microscopy and Microanalysis) Meeting, held in Hartford, CT on August 4th, 5th, 6th and 7th. Featured products will include a live demonstration of the Quartz X-One EDX system including ON-X the first SDD with integrated BSE detector, the newest release version of Quartz PCI, the Quartz Gatekeeper system and the newest release of its LIMS (Laboratory Information Management System).
The Quartz X-One EDX/EDS X-ray microanalysis system features the only Silicon Drift Detector (SDD) with integrated Take Off Angle Imaging – ON-X, so you can see what your detector sees. The X-One system also features a high performance – low maintenance SDD, an industry leading Pulse Process with the best coincidence detection at high rates and the highest spectrum fidelity for the combination of low energies at high count rates. The PCI X-One software is feature rich and easy to use.
Quartz PCI – Version 9.5 (http://www.quartzimaging.com/microscope-digital-image-acquisition-and-processing.html)
We will be previewing the soon to be released newest release of Quartz PCI Version 9.5, that includes numerous new features.
SEM Sharpness Measurement Tool (http://www.quartzimaging.com/pdf/Quartz-PCI-Feature-Sheet.pdf)
Based on ISO standards, this new feature of Quartz PCI software works with a single image or a group of images. SEM images can be measured regularly to monitor the performance of a SEM and a detailed report can be generated in just a few clicks. This is the latest feature of Quartz PCI. Quartz PCI has been helping microscopy labs capture, measure, annotate and process images and generate reports since 1993.
The Quartz Gatekeeper system features web-based instrument booking and scheduling, instrument access control with record keeping and reporting. The system operates with or without RFID card readers and has full administrative functionality.
Quartz LIMS (Laboratory Information Management System) (http://www.quartzimaging.com/laboratory-information-management-systems.html) is an ideal workflow solution for microscopy labs and FA-LIMS (Failure Analysis Laboratory Information System) is the world’s only LIMS system designed specifically for Semiconductor Failure Analysis Labs. Users of Quartz LIMS and FA-LIMS have reported significant time savings and improved effectiveness of their laboratory workflow. This next generation of Quartz LIMS and FA-LIMS have been improved in a number of key areas.
About Quartz Imaging Corporation
Quartz Imaging has more than 2,000 customers in 38 countries utilizing our industry leading solutions for Digital Image Acquisition and Processing (for most image producing instruments including SEMs, TEMs, STEMs, Tabletop SEMs, Cameras, PC Based Instruments, Scanners); 21 CFR Part 11 Compliance; Laboratory Information Management Systems (LIMS); Failure Analysis Lab Systems (FA-LIMS); Instrument Access Control; Instrument Remote Control; Automated Inspection Systems for Nanotechnology; X-ray Microanalysis (EDX/EDS) Systems and more.