The new PoroMetric pore analysis software and the Phenom SEM’s motorized stage make the automated acquisition and processing of large batches of data extremely simple.
Phoenix, AZ (PRWEB) September 25, 2014
The visualization and analysis of pores is easier than ever before with the Phenom desktop and integrated PoroMetric from Nanoscience Instruments. The combination of speed, ease of use and superb imaging quality of the Phenom and pore analysis software of PoroMetric creates a powerful tool for inspecting a wide range of samples like filters, membranes, foam, ceramics and other porous materials.
PoroMetric allows the user to get a better understanding of the characteristics of the materials, as it extracts detailed information of the complete set of pores. The user can easily analyze pore parameters such as pore size and aspect ratio and gather data on distribution of pores. The PoroMetric pore analysis software is the first in its class when it comes to measurements of pores as data on all pores is made available. This results in valuable information on the pore structure as well as the porosity and filtration process.
“The new PoroMetric software speeds up analysis of porous substrates,” says Matthew Jobbins, PhD., Applications Scientist at Nanoscience Instruments. “This new pore analysis software and the Phenom desktop SEM’s motorized stage make the automated acquisition and processing of large batches of data extremely simple.”
The fully automated measurements of PoroMetric pore analysis software allow a level of visual exploration beyond optical microscopy that can lead to new discoveries and innovations.
“Phenom World continues to extend the automated features of their Pro Suite software foundation. The emphasis on the enhancement of SEM imaging workflow has been our focus since the first generation Phenom’s were released in 2006,” explains Thomas Powers, Sales Director at Nanoscience Instruments. “PoroMetric now provides the added functionality of automatically detecting and analyzing pores, or embedded features within a specimen, rapidly determining filtration substrate effectiveness.”
To learn more about this product or the Phenom desktop SEM, please call us at 888-777-5573 or email us at info(at)nanoscience(dot)com.
About Nanoscience Instruments
Nanoscience Instruments provides surface science, microscopy and nanotechnology solutions that are easy to use with low maintenance. We offer solutions to image, measure, characterize and identify surfaces and materials.
Our products include desktop SEM s, portable AFMs & STMs, 3D optical profilers, nanoindenters, and micro and nano-manipulation systems, as well as consumables and accessories. More information is available from the Nanoscience Instruments website: http://www.nanoscience.com where we offer tomorrow’s solutions, today.