San Diego, CA (PRWEB) April 29, 2015
Gamma Scientific has announced the release of their new Thin Film Measurement Systems (http://www.gamma-sci.com/thin-film-measurement-systems-svc-techcon/) for high volume testing applications. The company will be performing demonstrations in booth 919 during SVC TechCon at the Santa Clara Convention Center in Santa Clara, CA.
Gamma Scientific’s proprietary technology enables manufacturers to perform non-destructive, non-contact, first surface spectral gonioreflectance measurements on transparent substrates.
Controlled optical geometry and industry leading spectroradiometer performance provide fast, precise measurements of first surface reflection while eliminating the contribution of the second surface.
This technology eliminates the need for manufacturers to cut samples and blacken or coarse grind the back side for testing reflective properties of thin film coatings.
Gamma Scientific systems capture complete spectral and colorimetric properties of thin film coatings with scan times of less than one second.
Film Thickness and Complex Refractive Index
In addition to measuring spectral and colorimetric properties, Gamma Scientific systems also measure film thickness and complex refractive index. The Thin Film Measurement Systems accommodate multi-layer film stacks 1nm to 10µm thick, depending on application, and feature a large, easily extendable library of materials.
With fast, flexible modeling and a 380nm-830nm wavelength range (other options available), Gamma Scientific Thin Film Measurement Systems are ideal for both high volume production lines and off-line Quality Assurance.
“The addition of film characterization capabilities to our Gonioreflectance Measurement Solutions lineup is an exciting milestone for Gamma Scientific. Our Reflectance Measurement system technology has been proven in laboratory and factory automation environments, and this added capability will bring added value to customers in new markets”, said Richard Austin, President of Gamma Scientific.
“We have demonstrated that film characterization using our gonio-spectroreflectometers is a cost-effective way to determine critical thin film parameters without the cost, time and complexity of traditional ellipsometric methods.”
Gamma Scientific Thin Film Measurement Systems are configured for use in a wide variety of testing applications. These include mobile devices, LED lighting, anti-reflective coatings, touchscreen displays, multi-function displays, CMOS image sensors and photovoltaic/solar cells.
About Gamma Scientific
With over 50 years of experience in developing light measurement instruments, Gamma Scientific (http://www.gamma-sci.com) is trusted by the world’s leading organizations to provide accurate and reliable results. Based in San Diego, California, Gamma Scientific manufactures laboratory grade thin film measurement systems, spectroradiometers, integrating spheres and calibration light sources. Gamma Scientific also operates an ISO 17025 compliant, NVLAP accredited calibration and testing laboratory (NVLAP Laboratory code 200823-0).