(PRWEB) December 20, 2015
The key feature of OPUS™ is AFM tip visibility: OPUS™ AFM tips are positioned exactly at the end of each cantilever at an angle of 90 degrees, which enables a precise tip positioning on the sample to be measured.
OPUS™ tips are available on all standard cantilever types for all commonly used AFM applications, including high speed scanning. OPUS™ AFM probes also offer all major coatings that are being used in AFM.
Other important features of OPUS™ AFM probes are:
- Tip sharpness better than 7 nm
- High Q-factor and smooth resonance curves
- A highly competitive pricing
Evaluation samples will be provided free of charge to interested AFM users.
For more information visit http://www.opustips.com.
To request an evaluation sample please follow this link: http://www.opustips.com/en/contacts.html