MikroMasch® Introducing OPUS™ AFM Tips, Featuring Tip Visibility

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MikroMasch® have introduced a new line of AFM tips – OPUS™

The key feature of OPUS™ is AFM tip visibility: OPUS™ AFM tips are positioned exactly at the end of each cantilever at an angle of 90 degrees, which enables a precise tip positioning on the sample to be measured.

OPUS™ tips are available on all standard cantilever types for all commonly used AFM applications, including high speed scanning. OPUS™ AFM probes also offer all major coatings that are being used in AFM.

Other important features of OPUS™ AFM probes are:

  •     Tip sharpness better than 7 nm
  •     High Q-factor and smooth resonance curves
  •     A highly competitive pricing

Evaluation samples will be provided free of charge to interested AFM users.

For more information visit http://www.opustips.com.

To request an evaluation sample please follow this link: http://www.opustips.com/en/contacts.html

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Nikoleta Tsvetkova
since: 11/2012
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