Reflex Photonics LightABLE Embedded Transceivers Demonstrate Their Ruggedness with Successful Accelerated Life Testing

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Reflex Photonics is proud to announce that its LightABLE™ LH Series SR4 full-duplex 4 lane transceiver have proven they can withstand 2000 hours of “Lifetime Test” with no degradation of their performance. The successful completion of this industry-standard test is a first step in Reflex Photonics’ comprehensive space qualification program for its rugged transceivers.

Reflex Photonics LightABLE embedded transceivers demonstrate their ruggedness with successful Accelerated Life Testing.

Reflex Photonics LightABLE embedded transceivers demonstrate their ruggedness with successful Accelerated Life Testing.

Dr. Jocelyn Lauzon, V.P. Engineering adds: This result confirms the long-term reliability of the LightABLE transceivers and their suitability for field deployment in harsh environments such as those found in military and space applications.

A group of modules from the LightABLE LH product series were submitted to a “Lifetime Test” against MIL-STD-883J, method 1005, cond. D, June 2013. The test is conducted at a case temperature of 100 °C, 15 °C more than the recommended maximum operating temperature.

These units were tested against Reflex Photonics’ final production test procedure on all 8 channels, at different intervals, and at 3 different operating temperatures: −40 °C, 23 °C, and 85 °C. Even after 2000 hours of exposure to 100 °C temperatures, the LightABLE units maintained their high operational performance.

The LightABLE products are parallel optic interconnects operating at 10 Gbps per lane and offering the following features: small SWaP, operation over a large temperature range (-40 °C to 85 °C), storage temperature from -57 °C to 125 °C. The LightABLE can be surface mounted or plugged on a board, and will support high temperature reflow process and operation with a link budget better than 13 dB.

Accelerated Life Testing
When products are exposed to temperature stresses in the field, Accelerated Life Testing is used to simulate product life. In order to accelerate aging, products are tested at temperatures above that of their normal operating temperature. Defects or failure that would only show up after many years in the field at normal operating temperatures can be detected in short times in an Accelerated Life Test.

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Jean-François Cyr
Reflex Photonics
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