Anton Paar Releases New Generation of Instruments for Mechanical Surface Testing

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The scratch testers, instrumented indentation testers, and tribometers can be combined on one platform or used separately. A technical redesign to Generation 3 scratch testers brought a number of new features which make the Anton Paar instruments the most versatile and precise instruments on the market.

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Based on Anton Paar’s unmatched 35 years of experience in nano- and micromechanical surface testing, the new functionalities of Anton Paar's scratch testers represent a great step forward for many users, especially for those who test many samples per day or perform advanced analysis.


In the field of indentation testing Anton Paar puts an emphasis on the advancement of versatility and user-friendliness. The new “Quick Matrix” indentation mode enables measurements which are seven times faster than before, for highly precise results in just a few minutes or up to 600 measurements per hour. Nanoindentation measurements are compliant with ISO 14577 i.e. quantitative measurements of standardized instrumented indentation testing (IIT). The new “Script” mode allows flexible and faster analysis in order to create customized analysis templates from exported data to get key results fast. The new “Generation 3” indentation testers also feature a noise floor which is two times lower than before, which leads to a value of 50 nN in force.

Anton Paar scratch testers are widely rated as an industry reference. The new “Generation 3” scratch testers provide the first automatic detection of critical loads on the market, with new algorithms for detection of slope changes on all the sensor signals (penetration depth, acoustic emission, or friction force). The patented “Panorama” mode (US 8261600,237, and EP 2065695) directly focuses on the scratch image to enable automation of scratch series measurements after the first focus. The Nano Scratch Tester even provides a 10 times better resolution than before which increases sensitivity for the characterization of very thin films.


The new statistics module of tribometers directly compares numerous tribological measurements with overlapped curves. It is therefore straightforward to compare the results of different tests. With the “Matrix” testing feature, a series of tribological measurements can be launched easily via the “Tribo” software. Any number of measurements can be started automatically without attending the instrument.

To mark the launch of the new instrument generation, Anton Paar offers a free demo testing of all involved products. To book a demo and get more information email to: tritec.application(at)anton-paar(dot)com    

For additional information, contact Pierre Morel at pierre.morel(at)anton-paar(dot)com or 804.550.1051.

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Jeff Linka
Anton Paar USA
+1 (800) 722-7556 Ext: 129
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Pierre Morel
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Anton Paar USA
since: 04/2010
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