Quartz Imaging Releases PCI-AM 5.0 Automated Measurement for Semiconductor Images

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Quartz Imaging Corporation has recently released PCI-AM version 5.0 - Automated Measurement for semiconductor features. Quartz PCI-AM performs automated measurements on cross section and top view images of trenches, pillars, lines and spaces, 2D shapes and complex features from semiconductor devices.

PCI-AM version 5.0 introduces a number of new features to our industry leading automated measurement software.

  • Users can now add reference line positions to the measurement settings dialog for each measurement. This allows you to predetermine exact location of measurements relative to the horizontal reference line.
  • With each new release version of PCI-AM we continue to provide improved edge detection capabilities. To further expand on our edge detection capabilities we have added a noise reduction filtering function.
  • To help our customers work with more types of images and features we have added the ability to divide the image into 3 different edge detection regions, allowing each region to have a separate edge detection setting. PCI-AM has different settings; Bright Ridge, Dark Ridge and Step, each with Sensitivity and Filter slide bars.

PCI-AM features 3 levels of automation. The first level of automation executes all of the desired measurements in a semiconductor feature. The second level of automation allows you to fully characterize an entire image with a single click. Batch Processing is the third level and it quickly characterizes an entire folder of similar images with a single click.

It can be very time consuming for engineers to measure the various features of a semiconductor device image. These manual measurements can also be inaccurate and there is frequently inconsistency between how engineers do the manual measurements. The collection of data is also often very time consuming as well.

With PCI-AM (Automated Measurement) module engineers simply click inside the feature and the measurement is done automatically with increased accuracy and consistency among all engineers. The measurement results are displayed on the image and in a spreadsheet grid. The data in the grid can be easily exported into a CSV file suitable for importation into other software such as Microsoft Excel. The images and data can also be easily included in standard Quartz PCI reports with just a few clicks.

About Quartz Imaging Corporation – Quartz Imaging has worked closely with semiconductor companies since it was founded in 1993, including the development of our industry leading Failure Analysis LIMS system (FA-LIMS and AL-LIMS) and is in the process of developing a LIMS system for electronic device Reliability Labs (REL-LIMS). Quartz Imaging has more than 2,400 customers in 38 countries utilizing our industry leading solutions for Digital Image Acquisition and Processing (for most image producing instruments including SEMs, TEMs, STEMs, Tabletop SEMs, Cameras, PC Based Instruments, Scanners); 21 CFR Part 11 Compliance; Laboratory Information Management Systems (LIMS); Instrument Access Control; Instrument Remote Control; Automated Inspection Systems for Nanotechnology and more.

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David Wood
Quartz Imaging Corporation
+1 604 488 3911 Ext: 151
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