All Angles: The New Nanostructure Analyzer SAXSpace
Ashland, Virginia (PRWEB) August 27, 2013 -- Whether at small angles, wide angles or at grazing incidence: the quality of X-ray scattering measurements hinges on the smart collimation of the employed X-rays. SAXSpace gives users more collimation choices than any other comparable system: The system’s SmartSAXS feature enables both line and point collimation – optionally even at once, with two beam lines connected to the same X-ray source.
Following up on the concept of versatility, SAXSpace now offers extended TrueSWAXS functionality: users can precisely analyze their samples’ overall nanostructure up to 200 nm as well as their crystal lattice at the atomic level below nanometer size – by performing continuous SAXS and WAXS measurements. These measurements can be run simultaneously, without any need to re-align the system.
SAXSpace particularly stands out for its ease of use. In older systems, the alignment of components with the X-ray beam is usually complex and time-consuming. SAXSpace offers an unprecedented solution to this issue: based on its TrueFocus feature, the system aligns itself automatically. Even seasoned SAXS operators will breathe a sigh of relief at the thought of quick and easy push-button alignment.
For further information contact Gerd Langenbucher: Tel (804) 550-1051;
Email: gerd.langenbucher(at)anton-paar(dot)com
Kristen Hangey, Anton Paar USA, http://www.anton-paar.com, +1 (800) 722-7556 118, [email protected]
Share this article