Silicon Turnkey Solutions (STS) Offers Expanded RF Capabilities to 110GHz

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Silicon Turnkey Solutions (STS), a Micross Company, announce the latest expansion of its Extremely High Frequency (EHF) and RF test capabilities to 110GHz.

Silicon Turnkey Solutions (STS), a Micross Company, announce the latest expansion of its Extremely High Frequency (EHF) and RF test capabilities to 110GHz. As part of continual expansions at STS, this valuable addition of the new N5247A 12-port Millimeter-Wave Network Analyzer to the RF Test Lab will extend the existing RF capabilities to 110GHz. This most recent advancement enables STS to continue propelling their engineering expertise even further into the millimeter and microwave applications in latest Antennas, Radars and signal generators through RFIC device design validation, screening, tests and qualifications.

The N5247A integration coupled with STS’s multiple Advantest 93k Systems provide a wealth of capabilities and repeatability not presently found in standard bench level testing. The N5247A supports true differential measurements across the 10-110GHz frequency range with integrated pulse measurement capabilities all while bringing bias signal incredibly close to the device being measured through built in Kelvin bias tee. This new dynamic by STS – using a Smart Scale/Port Scale Advantest ATE and integrated external Network Analyzer is revolutionizing the capabilities in the RF world by mating the highest quality systems together. The ability to improve overall yield and binning accuracy at die and package levels are additional by-products of the use of automated test equipment (ATE) versus traditional bench testers. Integration with ATE affords seamless single insertion ultra-accurate tests and automated data acquisition.

“One of the often overlooked advantages of the hybrid ATE model is the integrity of device power up and power down routines in a single insertion testing minimizing any latent damage to the device,” notes Zef Malik, GM of STS. In addition to being precise and quicker, an ATE with integrated WNA provides at speed testing and best signal fidelity. Deployment of the Smart Scale / Port scale RF, High Speed WNA and the Credence CX Fusion provides STS with the expanded portfolio to enable effective test solutions for Mixed Signal and RF semiconductors.

STS’s expertise with AEC-Q100, MIL-STD-750/883, as well as the many JEDEC standards make designs for the more recent radar systems used for dynamic or adaptive cruise control in automotive a perfect fit. Similarly, military customers requiring absolute reliability have a turnkey option with STS’s ability to go from wafer to a finished and qualified device worthy for the most ruggedized application. STS has an extensive history of successfully delivering complex devices like FPGAs, 32-bit+ processors and ASICs that presented virtually impossible thermal and fault coverage issues. STS will be applying the same ingenuity and engineering process for next generation RF devices. That’s why more and more customers – military/aerospace and commercial/industrial – count on STS for their most stringent RF testing needs and have earned a long-standing reputation for the highest reliability in the toughest environments.

About Silicon Turnkey Solutions
STS ( is an industry recognized collaborative partner that integrates design, engineering, manufacturing, test, and qualification processes with operational expertise to provide leading edge technology and services that enable customers to meet demanding time-to-market pressure, cost and technical challenges in today’s consumer, military, aerospace and commercial markets. STS is a Micross Company – with more than 25 years of electronic test expertise, which includes Micross Components ( and Micross UK.

Please direct inquires to media(at)sts-usa(dot)com

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Valerie Thomas
Micross Components
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